Aletheia Imaging Solutions Ltd

Aletheia Imaging Solutions Ltd（AIS）是曼彻斯特大学的一家工业计量公司。AIS商业计划的核心是一项创新的、正在申请专利的技术，即一种3D校准目标，能够在X射线计算机断层扫描（XCT）中计算空间分辨率和测量置信度。AIS 3D校准目标使用户能够利用XCT的巨大功能进行无损检测（NDT）。通过与行业合作伙伴合作进行的详细案例研究，AIS XCT计量方法已被证明是校准XCT设备的可靠方法。AIS方法旨在允许XCT用户检查增材制造（AM）组件的缺陷，以便将其部署在使命关键应用中。XCT只能作为使命关键部件的无损检测方法，前提是用于执行检查的XCT仪器经过校准，并且相应的空间分辨率和测量置信度值已知。AIS 3D校准目标提供这些参数。增材制造比其他制造方法更快、更经济，因此客户可以通过使用AIS方法将增材制造作为他们选择的制造技术来节省大量成本。尽管已经证明AIS 3D校准目标是有效的，并且是用于XCT计量的高效工具，但是目前还没有校准3D校准目标本身的方法。不可避免的是，用于生产AIS设备的制造过程中的误差将导致在假定相同的设备之间的小的几何变化。在这个项目中，AIS将与国家物理实验室（NPL）合作开发一个表征程序，使用扫描电子显微镜等成像技术来描绘3D校准目标上特征的尺寸。该例程将输出表征设备的“指纹”，详细说明研究中的实际设备与理想设计之间的任何差异。该项目将寻求确定进行表征的最佳成像技术，并参与开发数字解决方案，以使结果能够用于使用AIS设备的后续计算。该项目的成功完成将提高AIS 3D校准目标的实用性，并确保AIS保持其在XCT计量市场的世界领导者地位。

Aletheia Imaging Solutions Ltd (AIS) is an industrial metrology spin out from The University of Manchester. At the heart of the AIS business plan is an innovative, patent pending, piece of technology, a 3D calibration target capable of permitting the calculation of spatial resolution and measurement confidence in X-ray Computed Tomography (XCT). The AIS 3D calibration target enables users to exploit the vast capabilities of XCT for non-destructive testing (NDT) purposes. Through detailed case studies performed in collaboration with industrial partners, the AIS approach to XCT metrology has been proven to be a reliable means for calibrating XCT equipment. The AIS approach is intended to allow XCT users to inspect additively manufactured (AM) components for defects in order to allow them to be deployed in mission critical applications. XCT can only be relied upon as an NDT method for mission critical components if the XCT instruments employed to carry out the inspections are calibrated and the corresponding spatial resolution and measurement confidence values are known. The AIS 3D calibration target provides these parameters. AM is much faster and more economical than alternative fabrication methods, so customers stand to achieve vast cost savings by using the AIS approach to enable AM to be employed as their chosen manufacturing technique. Although it is proven that the AIS 3D calibration target works and is a highly effective tool for XCT metrology, there is currently no way of calibrating the 3D calibration targets themselves. It is inevitable that errors in the manufacturing processes used to produce the AIS devices will result in small geometric variations between supposedly identical devices. In this project, AIS will work with the National Physical Laboratory (NPL) to develop a characterisation routine to use imaging techniques such as scanning electron microscopy to profile the dimensions of the features on the 3D calibration targets. It is intended that this routine will output a "fingerprint" of the characterised device, detailing any variations between the actual device under investigation and the idealised design. The project will seek to determine the optimal imaging technique for carrying out the characterisation and engage in the development of a digital solution to enable the results to be used in subsequent calculations using the AIS devices. Successful completion of the project will enhance the utility of the AIS 3D calibration targets and ensure AIS maintains its position as a world leader in the XCT metrology market.