X-ray Enhancement and Attenuation in Hybrid Organic-Inorganic Detectors: In Search of new Markets

有机-无机混合探测器中的 X 射线增强和衰减：寻找新市场

• 批准号: 104946
• 金额: $ 3.18万
• 依托单位: SILVERRAY LTD
• 依托单位国家: 英国
• 项目类别: Collaborative R&D
• 财政年份: 2019
• 资助国家: 英国
• 起止时间: 2019 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=104946
• 关键词: ray; Enhancement; Attenuation; Hybrid; Organic

"X-rays are a somewhat widely used tool that enables features that cannot be observed through the use of visible light to be observed. This is in view of their highly penetrating nature through most materials. As such, these are used in medical imaging such as mamography, dentistry, evaluation of the mechanical integrity of pipes, ships, planes, identifying any undesired metallic contaminants during food processing among many others.In order to see or image features using X-rays, detectors which are somewhat similar in nature to cameras used in cell phones are employed. However, due to their design being based on established physical principles for bulk materials, these often require the use of high X-ray doses for features to be clearly observed.SilverRay Ltd. is a startup company that is aimed at disrupting the manner in which X-ray detection is conducted. The team at SilverRay have been able to develop a detector based on nanotechnology that enables a dose that is nearly 10-100 times lower than is used by current standard technologies. Surprisingly, we have identified this capability to be nearly x100-1000 higher than what is expected if the established rules used by the radiation physics community is followed. Therefore we believe that a new mechanism that has not been previously utilised in the X-ray detector technology is at the heart of this observed enhancement.A potential origin for the observed enhancements is the scattering of X-rays from nanoscale features. This is somewhat similar to the process that is often used by astrophysicists in order to identify dust particles in space (X-ray astronomy). While the team at SilverRay have managed to support this theory based on computer simulations, we are now gathering evidence to work towards experimentally proving this hypothesis. We believe that the use of specific measurement technologies that are able to identify a signature peak when a sample is hit by X-rays of single energy will help us to prove the mechanism. In the event that the proposed mechanism does indeed take place, we expect to see a distribution of peaks much like when the sample is hit by a probe consisting of X-rays of different energies. We believe that the team at the National Physical Laboratory with their extensive experience in developing metrology tools and measurement tools similar to what we are interested in, will be an ideal partner that will enable this characterisation problem to be solved."

“X 射线是一种使用广泛的工具，可以观察到通过使用可见光无法观察到的特征。这是因为它们对大多数材料具有高度穿透性。因此，X 射线用于医学成像，例如乳房X 射线摄影、牙科、评估管道、船舶、飞机的机械完整性、识别食品加工过程中任何不需要的金属污染物等。为了使用 X 射线查看或成像特征， 使用本质上与手机中使用的相机有些相似的检测器。然而，由于它们的设计基于散装材料的既定物理原理，因此通常需要使用高 X 射线剂量才能清楚地观察到特征。SilverRay Ltd. 是一家初创公司，旨在颠覆 X 射线检测的进行方式。 SilverRay 团队已经能够开发出一种基于纳米技术的探测器 其剂量比当前标准技术使用的剂量低近 10-100 倍。令人惊讶的是，如果遵循辐射物理学界使用的既定规则，我们发现这种能力比预期高出近 100-1000 倍。因此，我们相信，一种以前未在 X 射线探测器技术中使用过的新机制是这种观察到的增强的核心。观察到的增强的一个潜在来源是来自 X 射线的散射。 纳米级特征。这有点类似于天体物理学家经常使用的识别太空尘埃粒子的过程（X 射线天文学）。虽然 SilverRay 团队已经成功地基于计算机模拟支持了这一理论，但我们现在正在收集证据，努力通过实验证明这一假设。我们相信，使用能够识别样品受到单一能量 X 射线照射时的特征峰的特定测量技术将有助于我们 证明机制。如果所提出的机制确实发生，我们期望看到峰值的分布，就像样本被由不同能量的 X 射线组成的探针击中时一样。我们相信，国家物理实验室的团队在开发与我们感兴趣的类似的计量工具和测量工具方面拥有丰富的经验，将成为解决这一表征问题的理想合作伙伴。”