An STM/AFM Facility for Electroactive Materials Characterisation

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A Scanning Tunnelling Microscope (STM)/Atomic Force Microscope (AFM) facility for electroactive materials characterisation: This project is expected to address an identified need for the characterisation of electroactive structures using scanning probe microscopy and builds on local expertise in allied methods. The instrumentation includes an electrochemical STM for electrical testing of molecular wires, switches, transistors and other single molecule electronic components, together with a pico-force tunnelling AFM (PF-TUNA) for the measurement and correlation of nano mechanical and electrical properties of fragile structures over larger areas. The facility will be a core asset for researchers that use electroactive material on conducting substrates in fields including fundamental corrosion science, nanotechnology, and moltronics.