Advancing Electron Backscatter Diffraction Characterisation Techniques with a Refined Approach to Indexing via Template Matching
Advancing Electron Backscatter Diffraction Characterisation Techniques with a Refined Approach to Indexing via Template Matching
批准号:
1857810
负责人:
金额:
$0.0万
依托单位:
依托单位国家:
英国
项目类别:
Studentship
财政年份:
2016
资助国家:
英国
项目状态:
已结题
起止时间:
2016 至 --
中文摘要
电子背散射衍射(EBSD)是一种用于扫描电子显微镜(SEM)的表征技术。EBSD允许在晶体结构中确定晶胞的方向和相。通常使用霍夫变换对模式进行索引,该变换可以识别EBSP中的频带。然而,霍夫的缺点在于它没有考虑到EBSP的更精细的特征。模式匹配方法是作为一种索引ebsp的方法而引入的,以说明模式的更精细的方面。目的实现一种更快、更准确的ebsp索引模式匹配方法并演示其应用。方法-更新当前的图像相互关联,使用快速傅里叶变换-证明更新的索引是准确和精确的,足以索引真实的模式-使用多相材料探索相位辨别-演示使用多个检测器的新颖检测器设置-使用新的设置和索引来确定EBSP新颖内容的模式中心-使用应用于EBSP的快速傅里叶变换更新的图像相关性-改进步骤来纠正当前进展1 . ArXiv预印本论文,目前正在超显微镜上进行审查,题为“用一种改进的模板匹配方法索引电子后向散射衍射图案”。本文给出了一种新的索引方法,并对其进行了细化。收集和分析了用氢化锆鉴别相的概念验证的初步数据。陨石样品用于相辨别抛光并准备EBSD。直接电子探测器测试和目前购买真空兼容组件使用它们。存放目前正在建造的样品和探测器的阶段。
英文摘要
General overviewElectron backscatter diffraction (EBSD) is a characterisation technique used in the scanning electron microscope (SEM). EBSD allows the orientations and phases of the unit cell in a crystalline structure to be determined. Usually the patterns are indexed using a Hough transform, which can identify bands in the EBSP. The Hough, however, has shortcomings in that it doesn't take into account the finer features of the EBSP. The pattern matching approach has been introduced as a way to index EBSPs to account for the finer aspects of the pattern. ObjectivesTo implement a faster and more accurate pattern matching approach to indexing EBSPs and demonstrate applications thereof. Approach- Update the current image cross correlation to use a fast Fourier transfer- Demonstrate the updated indexing is accurate and precise enough to index real patterns- Explore phase discrimination using multi-phase materials- Demonstrate novel detector set ups using multiple detectors- Use the new set up and indexing to determine the pattern centre of an EBSPNovel content- The updated Image correlation using a fast Fourier transform applied to an EBSP- The refinement step to correct the first pass indexing- Applying this to phase discrimination- Using two direct electron detectors to collect and index two patterns simultaneouslyCurrent progress1 paper on preprint in ArXiv, currently under review in ultramicroscopy entitled " Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach." This paper demonstrates the new method of indexing and the refinement.Preliminary data for proof of concept collected and analysed for phase discrimination using Zirconium hydride. Sample of meteorite to use in phase discrimination polished and ready to EBSD.Direct electron detectors tested and currently buying vacuum compatible components to use them.Stage to hold the sample and detectors currently under construction.
期刊论文(1)
专著(0)
科研奖励(0)
会议论文
国内基金
海外基金
Muon--electron转换过程的实验研究
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批准号:11335009
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项目类别:重点项目
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资助金额:360.0万元
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批准年份:2013
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负责人:李海波
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依托单位: