Development of a Modular Reference Artifact to Characterise XCT Systems Performance and Facilitate the Adoption of Additive Manufacturing Technologies

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X-ray Computed Tomography (XCT) is an established 3D imaging technology employed extensively for medical imaging and materials characterisation. Identified as a capable inspection tool to facilitate the adoption of additive manufacturing (AM) in critical industry sectors, XCT can measure complex AM structures and internal geometries unachievable using traditional tactile and optical methods. However, XCT is not considered as mature for dimensional metrology as compared to conventional metrology counterparts. This project aims to develop a modular reference artefact to characterise multiple XCT performances simultaneously. The artefact will also facilitate the measurement of typical AM performance characteristics.