fundamental investigations of low energy (0-30 eV) electron induced processes for application to nanolithography, ballistic electronic devices and astrobiology

低能（0-30 eV）电子诱导过程的基础研究，应用于纳米光刻、弹道电子设备和天体生物学

• 批准号: 355908-2008
• 负责人: Sanche, Léon
• 金额: $ 2.49万
• 依托单位: Université de Sherbrooke
• 依托单位国家: 加拿大
• 项目类别: Discovery Grants Program - Individual
• 财政年份: 2011
• 资助国家: 加拿大
• 起止时间: 2011-01-01 至 2012-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=482933
• 关键词: fundamental; investigations; low; energy; 30

When a molecule in a solid adsorbs energy from ultra-violet light (UV), x-rays or another type of high energy radiation, it will likely be ionised and eject an electron. Occasionally this electron will have considerable energy and will travel far through the solid, ionizing (damaging) many other molecules. Mostly however, the electron will be of low energy, unable to travel very far or induce further damage through ionization. Indeed, in physicists' models of radiation damage, such low energy electrons (LEE) and their effects are usually ignored.

当固体中的分子吸收来自紫外线(UV)、X射线或其他类型的高能辐射的能量时，它很可能会被电离并射出一个电子。偶尔，这种电子会有相当大的能量，并会在固体中传播很远，电离(破坏)许多其他分子。然而，大多数情况下，电子将是低能量的，不能传播很远，也不能通过电离引起进一步的损害。事实上，在物理学家的辐射损伤模型中，这种低能电子(Lee)及其影响通常被忽略。