X-ray Fluorescence (XRF) Spectrometer for Elemental Analysis

用于元素分析的 X 射线荧光 (XRF) 光谱仪

• 批准号: 440645-2013
• 负责人: Leznoff, Daniel
• 金额: $ 6.29万
• 依托单位: Simon Fraser University
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2012
• 资助国家: 加拿大
• 起止时间: 2012-01-01 至 2013-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=507072
• 关键词: ray; Fluorescence; XRF; Spectrometer; Elemental

For all new materials, the most fundamentally important information is their composition - what elements are they made of? X-ray Fluorescence (XRF) spectroscopy uses X-rays to analyze the elemental composition of a sample, from sodium to uranium. X-rays, which hit the sample, cause element-specific XRF which is detected and quantified with sensitivities from ppm to 100%. This non-destructive technique can rapidly determine elemental makeup, including from inorganic materials, mineral samples and environmental pollutants and is especially valuable for examining mixtures, alloys and composites.

对于所有新材料来说，最重要的信息是它们的组成--它们是由什么元素组成的？X射线荧光(XRF)光谱学使用X射线来分析样品的元素组成，从钠到铀。击中样品的X射线会引起特定元素的XRF，它被检测并以从ppm到100%的灵敏度进行定量。这种非破坏性技术可以快速确定元素组成，包括从无机材料、矿物样品和环境污染物中确定元素组成，特别适用于检测混合物、合金和复合材料。