Probing intermolecular interactions and mapping topographic, nanomechanical, nanoelectrical properties of various materials and engineering systems by AFM

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The proposed atomic force microscope (AFM) system is the latest model and one of the world's highest performance system designed to provide exceptional sensitivity that enables simultaneous mapping of topography, nanomechanical, nanoelectrical, magnetic and other physical properties as well as interfacial chemical reaction processes for a broad range of materials (e.g., polymers, biopolymers, proteins, nanoparticles, surfactants), engineering and biological systems (e.g. nanoelectronics, oil sands engineering, mineral processing, clean coal processing) in vapors and complex fluids with nanoscale or even atomic resolution. The AFM system has an integrated environmental chamber that provides an easily accessible, sealed sample compartment totally isolated from the rest of the system with precisely controlled humidity, temperature and reactive gas environment to match any experimental requirements. It is particularly suitable for the characterization of intermolecular forces and surface properties of both soft and hard materials, nanoparticles and nanoelectronic devices where the highest sensitivity for measurements of surface properties (e.g. roughness, structure, elasticity, conductivity and chemical reactivity) is required.