An Automated Testing Framework for Verification of Measurements in Embedded Systems

嵌入式系统的开发、验证和验证存在设计挑战。我们的研究通过开发工具、技术和体系结构来帮助开发人员构建高可信的嵌入式系统，从而解决了这一挑战。国际测量组织(MI)开发了用于性能分析的系统，这些系统对电压、温度和电阻等不同指标的测量精度非常敏感。嵌入式实时系统通常由更小的模块组成，这些模块相互作用。装配单元必须使所有模块准确、正确地工作。在这个项目中，MI和研究团队将研究测试方法，并开发一个新的自动化测试框架，用于验证嵌入式系统中用于测量的设备。为了开发自动化测试框架，我们将确定用于测量的设备的环境和要求，表征缺陷，并分析最先进的测试方法。使用自动化测试框架，MI将能够确保预期更高精度的嵌入式系统测量的准确性。

Design challenges exist for development, verification and validation of embedded systems. Our researchaddresses this challenge by developing tools, techniques and architectures that assist developers in buildinghigh-confidence embedded systems. Measurements International (MI) develops systems that are used forperformance analysis, and these systems are very sensitive to accuracy of measurements of different metricssuch as voltage, temperature, and resistance.Embedded real-time systems often consist of smaller modules, which interact with each other. The assembledunit must have all the modules working precisely and correctly. In this project, MI and the research team willinvestigate testing approaches and develop a new automated testing framework for verification of devices usedfor measurements in embedded systems. To develop an automated testing framework, we will identify theenvironment and requirements of devices used for measurements, characterize defects, and analyzestate-of-the-art testing approaches. Using the automated testing framework, MI will be able to ensurecorrectness of measurements for embedded systems where higher accuracy is anticipated.