Hybrid Parallel Adaptive Finite Element Analysis and Design for High-Speed Microelectronic System Interconnections

本研究计划的目标是为高速微电子系统互连（MSI）的有效模拟开发新的，高度创新的，准确和可靠的数值方法。基于电路理论的仿真对于在由逻辑门和晶体管等组成器件决定的最大速度下运行的系统中验证信号完整性是有效的。然而，随着当今特征尺寸的缩小和时钟频率的增加，许多高速微电子系统设计的限制因素是互连延迟，而不是器件切换速度。此外，互连效应，如反射、串扰、色散和衰减，现在是信号损坏的主要来源，也是在更高运行速度下系统性能下降的重要原因。当这些条件普遍存在时，标准电路分析和传统仿真技术不足以准确预测微电子系统的性能。如今，微电子系统研究的最新进展在于开发创新的数值方法，能够准确、高效和可靠地模拟现代高速微电子系统中复杂的三维微加工结构中互连的电磁波波形。此外，当有效地生成这些信息时，它可以通过显着减少设计过程的总体时间和成本来产生重大影响。*** MSI结构的电磁行为研究是当前和未来几代高速微电子电路和系统的合成和设计的关键组成部分。这项研究的总体目标是开发先进的高性能计算方法，能够有效地模拟未来几代硬件中日益现实的微电子系统模型的电磁行为。最终，这项研究旨在通过提供实用和有效的仿真工具，使微电子工业受益，这些工具可以自信地用于及时预测新提出的设计在指定工程公差范围内的性能。**

The objective of this research program is to develop new, highly innovative, accurate and reliable numerical methods for the efficient simulation of high-speed microelectronic system interconnections (MSI). Simulations based on circuit theory have been effective for verifying signal integrity in systems operating at maximal speeds determined by constituent devices such as logic gates and transistors. However, with today's shrinking feature sizes and increasing clock frequencies, a limiting factor for many high-speed microelectronic system designs is interconnection delays rather than device switching speeds. Further, interconnection effects such as reflection, cross-talk, dispersion and attenuation are now leading sources of signal corruption and a significant cause of system performance degradation at higher operating speeds. Standard circuit analysis and conventional simulation techniques are not sufficient for accurately predicting microelectronic system performance when these conditions prevail. Today, the state-of the-art in MSI research lies in the development of innovative numerical methods capable of accurately, efficiently and reliably simulating the interconnection electromagnetic waveforms within the sophisticated 3-D micro-fabricated structures of modern high-speed microelectronic systems. Moreover, when this information is produced effectively it can have a major impact by significantly reducing the overall time and cost of the design process.***The study of the electromagnetic behaviour of MSI structures is a critical component for the synthesis and design of present and future generations of high-speed microelectronic circuits and systems. The overall goal of this research is to develop advanced high-performance computing methods capable of efficiently simulating the electromagnetic behavior of increasingly realistic models of microelectronic systems over future generations of hardware that will become available. Ultimately, this research is intended to benefit the microelectronics industry by providing practical and effective simulation tools that can be used with confidence to predict the performance of newly proposed designs to within specified engineering tolerances in a timely fashion. **