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基于超陡亚阈值摆幅器件的低功耗SRAM存储系统关键技术研究

批准号:
62104001
项目类别:
青年科学基金项目(C类)
资助金额:
30.0 万元
负责人:
卢文娟
依托单位:
学科分类:
集成电路设计
结题年份:
2024
批准年份:
2021
项目状态:
已结题
项目参与者:
卢文娟

项目摘要

结项摘要

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中文摘要
受玻尔兹曼热力学限制,传统硅基晶体管的亚阈值摆幅存在理论极限,严重阻碍了SoC芯片功耗的进一步降低。基于带带隧穿导通机制的隧穿场效应晶体管因具有超陡亚阈值摆幅、较低关态电流且与CMOS工艺兼容等特点在低功耗设计领域表现出很强的竞争优势。因此,本项目拟基于超陡亚阈值摆幅的隧穿晶体管对SoC核心存储部件SRAM进行低功耗设计。主要研究内容为:①基于读写分离及写路径动态切断机制,并结合工艺因素实现对隧穿晶体管型存储单元的拓扑设计和可靠性评估;②基于次级时钟驱动的并行架构及多参数联合优化能耗模型,实现集成隧穿晶体管的SRAM存储系统架构优化及能耗建模;③针对器件差异性,设计兼容隧穿晶体管的SRAM存储系统关键电路,并利用蒙特卡洛方法完成电路的可靠性分析。本项目最终将在CMOS工艺下实现集成隧穿晶体管的低功耗SRAM芯片原型,促进国产超低功耗SoC芯片的研制,进而为下一代物联网的发展提供技术支持。
英文摘要
Limited by Boltzmann thermodynamics, the theoretical limit of the subthreshold amplitude of traditional silicon-based transistor seriously hinder the further reduction of the power consumption of System-on-Chip (SoC). The tunneling field effect transistor (TFET) device based on band to band tunneling mechanism has shown strong competitive advantages in the field of low-power design due to its characteristics such as ultra-steep sub-threshold swing, low off-state current and high compatibility with CMOS process. Hence, based on the TFET device with ultra-steep sub-threshold swing, this project intends to design the low power SRAM system, which acts as the core memory component of SoC. The main research contents of this project include: ① Combined with process factors, the topological study and the reliability evaluation of the tunneling transistor memory cell will be executed on the base of the mechanism of read/write separation and write path dynamic cut-off; ②Based on the secondary clock-driven parallel architecture and optimized energy consumption model with joint multi-parameter, architecture optimization and energy consumption modeling will be carried out for SRAM storage system with integrated TFET devices; ③ The design of the key circuits for SRAM storage system with the compatible tunneling transistor will be realized according to the device difference, and the reliability analysis of the circuit is completed by Monte Carlo method. Finally, the implementation of this project will form the prototype of a low-power SRAM memory chip integrated with TFET devices under CMOS technology and further promote the development of domestic ultra-low power SoC, which provides technical support for the development of the next generation of Internet of things in China.
随着物联网应用的急速增长,片上系统芯片(System on Chip, SoC)功耗问题已成为制约移动智能终端发展的瓶颈,静态随机存储器(SRAM)作为SoC的核心存储部件,低功耗SRAM设计已成为业界追逐的热点。隧穿场效应晶体管(TFET)器件由于能够打破传统MOS器件亚阈值摆幅在常温下60mV/dec的限制成为低功耗设计的重要候选之一。但TFET SRAM电路设计仍面临正偏p-i-n电流问题、TFET器件堆叠问题、TFET器件的延迟输出饱和问题以及半选干扰问题等诸多挑战,本项目基于CMOS工艺开展兼容超陡亚阈值摆幅TFET器件的低功耗SRAM存储电路关键技术研究。.针对现有设计瓶颈,基于读写分离技术及写路径动态切断机制,设计了多款基于隧穿晶体管的C-T型SRAM存储单元拓扑结构,并在读写噪声容限、半选干扰、读写速度和功耗等方面进行可靠性以及性能评估,结果表明所设计单元结构具备更优性能及更高可靠性。.针对SRAM存储系统关键电路进行优化设计,提出了两种基于TFET器件的双边沿触发器电路结构:TBDET和EBDET,利用多个锁存单元及反馈回路的设计,避免了传输门引起的正偏p-i-n电流问题,研究结果表明所设计的触发器可以有效的阻塞毛刺产生的冗余跳变,并在速度和功耗等方面都得到明显的改善。同时,提出了一种能够适应低电压工作环境,通过位线自控制关断方式实现低失调、高速放大功能的锁存型感应放大电路,仿真结果表明了该结构在放大速度、失调电压、放大能耗等多方面性能上具有自身优势,并且具有更好的抗PVT波动的能力,从而提高SRAM数据读取速度,并降低功耗。.最后,项目采用多参数联合优化的方法进行SRAM存储系统能耗的建模,实现系统性能和功耗的优化设计,并最终完成了容量为1Kb(32×32)的混合型SRAM存储系统的设计与实现。.本项目的研究结果突破了TFET器件应用于SRAM存储电路系统的一系列瓶颈,对进一步实现国产超低功耗SoC芯片乃至推动便携移动电子设备的发展具有重要科学研究意义和实际应用前景。
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