自支撑超薄膜与基底之间界面吸附能的定量测量和机理研究

自支撑超薄（SSUT）膜是制作微/纳机电系统和新型光电器件的主要功能部件。SSUT膜与基底之间的界面吸附，不但在其制备、转移、组装和应用中扮演着极其重要的角色，而且也为表面和界面问题的基础理论研究提供了一个理想的模型系统。然而，由于尚未建立起行之有效的实验方法，人们很难准确表征和理解这类特殊的界面吸附行为。本项目拟开展如下主要研究：①创建一种基于光学显微镜纳米操纵技术的悬拱桥测试法，能准确测定可控环境下各种SSUT膜与不同基底之间的界面吸附能；②建立起界面吸附能与各种潜在影响因素（薄膜的弯曲刚度、界面材质和粗糙度、环境温度和湿度等）之间的定量依赖关系；③结合实验测试、理论计算和模拟深入探究对应的吸附机理。本项目建立起来的普适测试方法和获得的实验和理论结果，将不仅为SSUT膜的制备、转移、组装和应用提供重要的理论和技术支持，而且有望为表面和界面科学的基础研究带来突破性的进展。

The interfacial adhesion energy between self-supporting ultrathin (SSUT) films and substrates plays a critical role on the fabrication, transfer, assembly, and application of SSUT films, and also provides an ideal model system for the fundamental research of surface and interfacial science. However, due to the significant difficulties in characterisation method and technology, an effective methodology for the accurate measurement of interfacial adhesion energy between SSUT films and substrates is still absent, and the understanding of the underlying physical mechanism remains largely unclear. The main aims of the proposal are: (1) to establish a new bridging test based on optical microscope nano-manipulation for accurately characterising the interfacial adhesion energy between SSUT films and substrates under controlled environments; (2) to establish the quantitatively dependences of interfacial energy on the experimental factors including the thickness and bending rigidity of ultrathin films, material combination and roughness of the interfaces, environmental temperature and atmosphere; (3) to explore the underlying physical mechanisms of the interfacial adhesion behaviour by combining experimental characterisation with theoretical calculations and simulations. The proposal is expected to able to effectively solve the issue of accurate measurement interfacial adhesion between SSUT films and substrates, and thus provides theoretical and technical supports for the fabrication and application of SSUT films, and furthermore brings breakthroughs in surface and interface science.