Self-consistent, unbiased root-mean-square emittance analysis
Self-consistent, unbiased root-mean-square emittance analysis
复制标题
自洽、无偏均方根发射度分析
DOI：
10.1063/1.1695649
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发表时间：
2004
影响因子：
1.6
通讯作者：
R. Keller
中科院分区：
文献类型：
--
作者：
M. Stockli;R. Welton;R. Keller
我们提出了一个自洽的方法来分析测量的发射度数据，产生无偏估计的均方根（RMS）发射度。自洽、无偏椭圆排除分析使用椭圆确定椭圆外数据的偏差，然后根据椭圆内减去偏差的数据计算均方根发射度。增加椭圆尺寸直到rms发射度估计饱和允许确定包括所有真实的信号（甚至是隐藏在噪声中的那些信号）的最小椭圆区域。椭圆形状和方向的变化被用来测试结果的鲁棒性。背景波动引起均方根发射度估计值的波动，均方根发射度估计值是对分析过程中产生的不确定性的估计值。
We present a self-consistent method for analyzing measured emittance data that yields unbiased estimates for the root-mean-square (rms) emittance. The self-consistent, unbiased elliptical exclusion analysis uses an ellipse to determine the bias from the data outside the ellipse, before calculating the rms emittance from the bias-subtracted data within the ellipse. Increasing the ellipse size until the rms emittance estimate saturates allows for determining the minimum elliptical area that includes all real signals, even those buried in the noise. Variations of the ellipse shape and orientations are used to test the robustness of the results. Background fluctuations cause fluctuations in the rms emittance estimate, which are an estimate of the uncertainty incurred through the analysis.