Searching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD
Searching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD
复制标题
通过监测 LHD 中的杂散微波辐射来寻找 O-X-B 模式转换窗口
DOI：
10.1063/1.2336460
复制
发表时间：
2006
影响因子：
1.6
通讯作者：
T. Mutoh
中科院分区：
文献类型：
--
作者：
H. Igami;S. Kubo;H. Laqua;K. Nagasaki;S. Inagaki;T. Notake;T. Shimozuma;Y. Yoshimura;T. Mutoh
在大螺旋装置中，在电子回旋加热期间，杂散微波辐射通过使用所谓的嗅探器探针来监测。在杂散辐射监测中，我们通过改变微波束的注入角度，寻找O-X-B模转换窗口来激发电子伯恩斯坦波。当微波束注入到O-X-B模式转换窗口附近时，稠密等离子体中心部分的电子温度升高。在这种情况下，注入天线附近的杂散辐射水平变低。这些结果表明，监测注入天线附近的杂散辐射有助于确定简单的EBW激励的有效性，而无需精确的分析。
In the Large Helical Device, the stray microwave radiation is monitored by using so-called sniffer probes during electron cyclotron heating. In monitoring the stray radiation, we changed the microwave beam injection angle and search the O-X-B mode-conversion window to excite electron Bernstein waves (EBWs). When the microwave beam is injected toward the vicinity of the predicted O-X-B mode-conversion window, the electron temperature rises in the central part of overdense plasmas. In that case, the stray radiation level near the injection antenna becomes low. These results indicate that monitoring the stray radiation near the injection antenna is helpful in confirming the effectiveness of excitation of EBWs simply without precise analysis.