Calibration of coercive and stray fields of commercial magnetic force microscope probes
Calibration of coercive and stray fields of commercial magnetic force microscope probes
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DOI：
10.1109/tnano.2008.917785
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发表时间：
2008-05-01
影响因子：
2.4
通讯作者：
Vazquez, Manuel
中科院分区：
文献类型：
--
作者：
Jaafar, Miriam;Asenjo, Agustina;Vazquez, Manuel
介绍了可变场磁力显微镜（MFM）来表征与解释MFM成像相关的市售MFM探针的磁性行为。A Nanotec Electronica S.L.显微镜已经被方便地修改为在轴向方向（高达1.5 kOe）和面内方向（高达2.0 kOe）施加磁场。通过测量施加磁场时观察到的MFM对比度的变化，产生了探头的轴向和横向磁滞回线。MFM信号的变化归因于尖端的磁状态的修改。这是通过所检查的纵向记录介质的大介电率（类似于1.7kOe）实现的。探针的特性取决于涂层材料、宏观尖端形状和尖端半径。仅在少数情况下，探头的磁化可以沿着面内取向取向。此外，通过测量探针在被测样品的磁状态下的影响，推导出探针尖端的杂散场。
Variable-field magnetic force microscope (MFM) is introduced to characterize the magnetic behavior of commercially available MFM probes that is relevant to interpret MFM imaging. A Nanotec Electronica S.L. microscope has been conveniently modified to apply magnetic fields in axial direction (up to 1.5 kOe) and in-plane direction (up to 2.0 kOe). Axial and transeverse hysteresis loops of the probes have been generated by measuring the changes in the MFM contrast observed when the magnetic field is applied. The variation of the MFM signal is ascribed to the modification of the magnetic state of the tips. This is enabled by the large coercitivity (similar to 1.7 kOe) of the checked longitudinal recording media. The properties of the probes depend on the coating material, the macroscopic tip shape, and tip radius. In only a few cases, the magnetization of the probe can be oriented along in-plane orientation. In addition, the stray field of the tips has been deduced by measuring the influence of the probe in the magnetic state of the checked samples.