Versatile scanning near-field optical microscope for material science applications
Versatile scanning near-field optical microscope for material science applications
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适用于材料科学应用的多功能扫描近场光学显微镜
DOI：
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
M. Allegrini
中科院分区：
文献类型：
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作者：
P. Gucciardi;M. Labardi;S. Gennai;F. Lazzeri;M. Allegrini
我们描述了一种孔径发射模式扫描近场光学显微镜 (SNOM)，针对材料表面科学应用进行了优化。该仪器可以在透射和反射配置下运行，以便研究透明和不透明的样品。它采用光学剪切力检测来控制尖端/样品距离，旨在最大限度地减少对探测光的干扰。 SNOM 头已完全集成在自制原子力显微镜平台上，并放置在受控气氛室中，以减少表面污染物。在我们仪器的紧凑性和多功能性范围内，我们能够以 λ/20 横向分辨率光学区分不同的材料，并区分聚合物聚集体，而不损坏表面，尽管它们的光学对比度相当差。
We describe an aperture emission mode scanning near-field optical microscope (SNOM), optimized for material surface science applications. This instrument can be operated in both transmission and reflection configurations, in order to investigate transparent as well as opaque samples. It employs optical shear-force detection for tip/sample distance control, designed to minimize interference with the probe light. The SNOM head has been fully integrated on a homemade atomic force microscope platform and is placed in a controlled atmosphere chamber for reduction of surface contaminants. Within the compactness and the versatility obtained in our instrument, we have been able to optically discriminate different materials with a λ/20 lateral resolution, and to distinguish polymeric aggregates, without damaging the surface, in spite of their rather poor optical contrast.