Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
复制标题
使用连续校验和的线性模拟电路中的并发错误检测和容错
DOI：
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发表时间：
1993
影响因子：
2.8
通讯作者：
A. Chatterjee
中科院分区：
文献类型：
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作者：
A. Chatterjee
研究了并发错误检测和容错问题。这些时变函数的校验和是可能的，因为线性模拟电路的函数可以用一组矩阵来数学地表示，校验和代码可以应用于这些矩阵。为了进行错误检测，假设故障会导致无源电路元件的值偏离其正常值，导致线路短路或开路，或改变有源元件（运算放大器）的工作特性。如果线性模拟电路的指定参数由于故障而改变，并且故障电路表现为线性系统，则通过补偿改变的参数值来执行误差校正。否则，部分校正是可能的。误差检测和校正是通过添加到线性模拟电路的少量硬件来执行的。无论电路大小如何，硬件开销几乎是恒定的，并且可以容易地校准错误检测电路对故障的灵敏度。>
The problem of concurrent error detection and fault tolerance is studied. These checksums of time-varying functions are possible because the function of a linear analog circuit can be represented mathematically by a set of matrices to which checksum codes can be applied. For the purpose of error detection, it is assumed that a fault can cause the value of a passive circuit component to deviate from its normal value, result in a line short or open, or change the operating characteristics of the active components (operational amplifiers). If the specifying parameters of a linear analog circuit change due to a fault and the failed circuit behaves as a linear system, then error correction is performed by compensating for the changed parameter values. Otherwise, partical correction is possible. Error detection and correction are performed by a small amount of hardware added to the linear analog circuit. The hardware overhead is virtually constant irrespective of the circuit size, and the sensitivity of the error detection circuit to failures can be easily calibrated. >