Characterization of recast Nafion films by small- and wide-angle X-ray scattering
Characterization of recast Nafion films by small- and wide-angle X-ray scattering
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DOI：
10.1002/macp.1994.021951204
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发表时间：
1994-12
影响因子：
2.5
通讯作者：
J. Halim;G. Scherer;M. Stamm
中科院分区：
文献类型：
--
作者：
J. Halim;G. Scherer;M. Stamm
采用小角和广角X射线散射（SAXS和WAXS）对不同湿度下制备的室温改性Nafion 1薄膜进行了表征。SAXS表明，湿度影响这些聚合物膜中的离子簇的大小。结果表明，随着相对湿度的增加，离子团簇的数量和尺寸增加。WAXS表明骨架聚合物的局部有序区域的存在。这些结果允许在不同湿度下固化的Nafion重铸膜的电化学行为的定性理解，如文献中所述。
Room temperature recast Nafion1 films, prepared under different humidities in the curing atmosphere, were characterized by small- and wide-angle X-ray scattering (SAXS and WAXS). SAXS reveals that the humidity influences the size of the ionic clusters in these polymer films. It was found that the number and size of ionic clusters increases with increasing relative humidity. WAXS indicates the presence of locally ordered regions of the backbone polymer. These results allow a qualitative understanding of the electrochemical behaviour of Nafion recast films cured at different humidities, as described in the literature.