Reproducible attachment of micrometer sized particles to atomic force microscopy cantilevers
Reproducible attachment of micrometer sized particles to atomic force microscopy cantilevers
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DOI:
10.1063/1.2190068
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发表时间:
2006-04-01
影响因子:
1.6
通讯作者:
Fuchs, H
中科院分区:
文献类型:
--
作者:
Mak, LH;Knoll, M;Fuchs, H
We present a method, which allows attaching micrometer sized spheres to an atomic force microscope cantilever in a reproducible manner. Spheres of different size with a minimum amount of glue are attached to a predefined position on the cantilever. This is performed by using an optical microscope and a laser-pulled micropipette, which guarantees nondestructive handling of the delicate cantilever beams. The method employs a simple setup consisting of a stereomicroscope and a micromanipulator. Images of the modified cantilevers were taken with a scanning electron microscope to clarify the position of the glued spheres on the cantilever. Electron dispersive x-ray analysis reveals that the surface of the microsphere is not covered with the glue, except at the contact area to the cantilever. (c) 2006 American Institute of Physics.