Roughness Estimation of Polycrystalline Iron Surface under High Temperature by Small Glancing Angle X-ray Scattering
Roughness Estimation of Polycrystalline Iron Surface under High Temperature by Small Glancing Angle X-ray Scattering
复制标题
小掠射角X射线散射估算高温下多晶铁表面粗糙度
DOI：
10.2355/isijinternational.44.1549
复制
发表时间：
2004
影响因子：
1.8
通讯作者：
Kentaroh Yoshida
中科院分区：
文献类型：
--
作者：
Y. Fujii;T. Nakayama;Kentaroh Yoshida
在10 - 6 Pa的真空中在500°C下烘烤20 h之前和之后的多晶铁表面的表征通过使用紧凑型超高真空（UHV）X射线衍射仪的小掠射角X射线散射来进行。在小掠射角入射的X射线的散射的X射线强度分布的加宽出现在烘烤的试样上。实验结果与一些表面结构模型的计算模拟进行了比较，并表明烘烤后的表面粗糙度估计约为烘烤前的十倍。这一结果与原子力显微镜观察的结果是一致的，并表明，掠射角X射线散射与紧凑型UHV X射线衍射仪的使用是一种有用的技术，用于工业材料表面的无损检测。
Characterization of polycrystalline iron surfaces before and after baking at 500°C for 20 h in a vacuum of 10 - 6 Pa is performed by small glancing angle X-ray scattering with use of a compact ultrahigh vacuum (UHV) X-raydiffractometer. A broadening of the scattered X-ray intensity profiles at a small glancing angle incidence of the X-ray appears on the baked specimen. The experimental results are compared with calculated simulation with some surface structure models, and show that the roughness of the surface after the baking is estimated to be about ten times of that before baking. This result is consistent with the result of AFM observation, and shows that glancing angle X-ray scattering with the use of a compact UHV X-ray diffractometer is a useful technique for non-destructive inspection of industrial material surfaces.