Ultrafast electron diffraction with radio-frequency compressed electron pulses
Ultrafast electron diffraction with radio-frequency compressed electron pulses
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DOI：
10.1063/1.4747155
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发表时间：
2012-08-20
影响因子：
4
通讯作者：
Siwick, Bradley J.
中科院分区：
文献类型：
--
作者：
Chatelain, Robert P.;Morrison, Vance R.;Siwick, Bradley J.
我们报告的时间分辨率的超快电子衍射（UED）仪器的射频电子脉冲压缩的基础上的完整表征。通过使用有质动力相互作用进行电子-激光脉冲互相关测量，直接在泵浦-探测几何结构中确定仪器的时间脉冲响应函数。在最佳设置下，在0.1 pC的聚束电荷（6.24 x 10（5）电子/脉冲）下测量到334 +/- 10 fs的稳定脉冲响应;与没有脉冲压缩的性能相比，这是一个显著的改善。相位稳定性目前将UED衍射仪的脉冲响应限制在334-500 fs的范围内，用于范围在0.1和0.6 pC之间的聚束电荷。(C)2012年美国物理学会。[http：//dx.doi.org/10.1063/1.4747155]
We report on the complete characterization of time resolution in an ultrafast electron diffraction (UED) instrument based on radio-frequency electron pulse compression. The temporal impulse response function of the instrument was determined directly in pump-probe geometry by performing electron-laser pulse cross-correlation measurements using the ponderomotive interaction. With optimal settings, a stable impulse response of 334 +/- 10 fs was measured at a bunch charge of 0.1 pC (6.24 x 10(5) electrons/pulse); a dramatic improvement compared to performance without pulse compression. Phase stability currently limits the impulse response of the UED diffractometer to the range of 334-500 fs, for bunch charges ranging between 0.1 and 0.6 pC. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4747155]