Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES
Layer-dependent band dispersion and correlations using tunable soft X-ray ARPES
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DOI：
10.1209/epl/i2004-10052-6
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发表时间：
2003-11
期刊：
影响因子：
1.8
通讯作者：
N. Kamakura;Y. Takata;T. Tokushima;Y. Harada;A. Chainani;K. Kobayashi;S. Shin
中科院分区：
文献类型：
--
作者：
N. Kamakura;Y. Takata;T. Tokushima;Y. Harada;A. Chainani;K. Kobayashi;S. Shin
软X射线角分辨光电子能谱被应用于研究镍的面内能带色散作为探测深度的函数。使用hν = 190和780 eV之间的光子能量来有效地探测高达~ 3-7层（~ 5-12 A）。结果表明，与已知的使用紫外线获得的顶部1-2层色散相比，在3层或更多层中穿过费米能级的Δ2↓少数自旋带的层依赖性带色散。层的依赖性对应于交换分裂的增加值，并建议减少相关性的影响相比，在散装的表面。
Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of nickel as a function of probing depth. Photon energies between hν = 190 and 780 eV were used to effectively probe up to ~ 3–7 layers ( ~ 5–12 A). The results show layer-dependent band dispersion of the Δ2↓ minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.