Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy
Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy
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DOI：
10.1017/s0885715613000109
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发表时间：
2013-06-01
影响因子：
0.5
通讯作者：
Majumdar, Debasis
中科院分区：
文献类型：
--
作者：
Blanton, Thomas N.;Majumdar, Debasis
为了研究从氧化石墨烯(GO)制备石墨烯的替代方法，将GO暴露在高能X射线辐射下。用X射线衍射(XRD)、X射线光电子能谱(XPS)和原子力显微镜(AFM)对辐照前后的GO进行了表征。结果表明，在高能辐射下，GO转变为导电的无定形碳相。(C)2013年国际绕射数据中心。
In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive. (C) 2013 International Centre for Diffraction Data.