X-Ray Photoelectron Spectroscopy
X-Ray Photoelectron Spectroscopy
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DOI：
10.1007/978-3-642-46571-0_7
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发表时间：
1986
期刊：
影响因子：
--
通讯作者：
G. Wertheim
中科院分区：
文献类型：
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作者：
G. Wertheim
具有特征X射线的光电子能谱在六十年代后期由Kai Siegbahn和乌普萨拉的合作者发展成为一种有用的分析技术。最重要的应用依赖于测量核心电子结合能的微小变化的能力，这与原子的价态和化学键合有关。在金属中，核-电子结合能是固体内聚能的函数。在大块金属的表面或在小金属簇中的内聚能的变化在核电子结合能中找到表达。对金属芯电子光电子能谱的更详细分析揭示了伴随高能电子射出的集体激发的贡献，包括传导电子的屏蔽响应，它改变了主线的形状，以及等离子体激元和带间跃迁的激发，它们表现为这条线的卫星。该技术也可用于获得金属和合金的价带态密度，特别适用于薄（20埃）表面层的元素分析。
Photoelectron spectroscopy with characteristic x-rays was developed into a useful analytical technique by Kai Siegbahn and collaborators at Uppsala in the late sixties. The most important applications depend on the ability to measure small shifts in core-electron binding energies, which are related to the valence state and chemical bonding of the atom. In metals the core-electron binding energy is a function of the cohesive energy of the solid. Changes in the cohesive energy at the surface of a bulk metal, or in a small metal cluster, find expression in the core-electron binding energy. More detailed analysis of core-electron photoemission spectra from metals reveals the contributions of the collective excitations which accompany the ejection of an energetic electron. These include the screening response of the conduction electrons, which modifies the shape of primary line, and the excitation of plasmons and interband transitions, which manifest themselves as satellites of this line. The technique can also be used to obtain the valence band density of states of metals and alloys, and is particularly well adapted to the elemental analysis of thin (20 Å) surface layers.