Power Supply Noise: Causes, Effects, and Testing
Power Supply Noise: Causes, Effects, and Testing
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电源噪声：原因、影响和测试
DOI：
10.1166/jolpe.2010.1075
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
I. Polian
中科院分区：
文献类型：
--
作者：
I. Polian
随着技术的扩展，数字电路中的电流密度显著增加。因此，影响配电网络的噪声或电源噪声越来越多地损害电路功能和时序。由于使用设计方法解决所有电源噪声问题变得越来越困难，因此在制造测试期间考虑噪声影响变得越来越重要。本文概述了不同类别的电源噪声以及用于识别可能因这些影响而失效的电路的测试方法。大多数检测电源噪声的测试策略与传统测试方法有很大不同，因为它们必须考虑功耗曲线、开关活动、电网设计、物理邻近性或多周期效应等信息。
With technology scaling, the current densities in digital circuits increase significantly. As a consequence, noise which affects the power distribution network, or power supply noise, increasingly compromises the circuit functionality and timing. As it becomes more and more difficult to address all power supply noise issues using design methods, considering noise effects during manufacturing test gains importance. This article provides an overview of different classes of power supply noise and test methods used to identify circuits which are likely to fail due to these effects. Most test strategies to detect power supply noise differ significantly from conventional test approaches because they must consider information such as power consumption profiles, switching activity, power grid design, physical proximity, or multi-cycle effects.