SURFACE-STRUCTURES OBSERVED BY HIGH-RESOLUTION UHV ELECTRON-MICROSCOPY AT ATOMIC LEVEL
SURFACE-STRUCTURES OBSERVED BY HIGH-RESOLUTION UHV ELECTRON-MICROSCOPY AT ATOMIC LEVEL
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DOI：
10.1143/jjap.26.l957
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发表时间：
1987-06-01
期刊：
影响因子：
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通讯作者：
YAGI, K
中科院分区：
文献类型：
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作者：
TAKAYANAGI, K;TANISHIRO, Y;YAGI, K
使用专为原子水平原位表面研究而设计的新型高分辨率电子显微镜，揭示了从几个原子到几十个原子生长的金簇的动态过程和结构。原位显微镜还阐明了使用轮廓图像在颗粒上形成的 Au (100) 5× 1 和 (110) 2× 1 表面的重建结构的细节。在反射显微镜模式下，可以看到Si(111)表面的7×7重构结构，具有2.3 nm的超晶格条纹。因此，事实证明，透射和反射模式下的原位高分辨率电子显微镜观察对于研究表面的动态行为非常有用。
The dynamic processes and structure of an Au cluster growing from a few to several tens of atoms have been revealed using a new high-resolution electron microscope designed specially for in situ surface study at atomic level. The in situ microscopy has also clarified details of the reconstructed structure of Au (100) 5× 1 and (110) 2× 1 surfaces formed on particles using profile images. In the reflection microscope mode, the 7× 7 reconstructed structure of the Si (111) surface has been seen with 2.3 nm superlattice fringes. In situ high-resolution electron microscope observations in transmission and reflection modes are thus demonstrated to be useful for studies of the dynamic behavior of surfaces.