High-resolution TEM microscopy study of the creep behaviour of carbon-based cathode materials
High-resolution TEM microscopy study of the creep behaviour of carbon-based cathode materials
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DOI:
10.1016/j.msea.2017.01.061
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发表时间:
2017-02
期刊:
影响因子:
6.4
通讯作者:
Wei Wang-;Weijie Chen;W. Gu
中科院分区:
文献类型:
--
作者:
Wei Wang-;Weijie Chen;W. Gu
Creep is in close relationship with the materials deterioration and deformation of the cathodes in aluminum reduction cells. The purpose of this work is to obtain the creep mechanism of the carbon cathode for aluminum electrolysis. A modified Rapoport equipment was used for measuring the creep strain of the semi-graphitic cathodes during aluminum electrolysis with CR=2.5 and at temperature of 945 ℃. The arrangement of carbon atom has been studied after hexagonal graphite converting into rhombohedral graphite during aluminum electrolysis by XRD and high-resolution transmission electron microscopy (HRTEM). The creep deformation of the carbon cathode has a close relationship with the mobile dislocation walls. These results will be helpful in controlling the cathode quality and its performance in aluminum reduction cells.