Ultra-low threshold InAs/GaAs quantum dot microdisk lasers on planar on-axis Si (001) substrates
Ultra-low threshold InAs/GaAs quantum dot microdisk lasers on planar on-axis Si (001) substrates
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DOI:
10.1364/optica.6.000430
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发表时间:
2019-04
期刊:
影响因子:
10.4
通讯作者:
Taojie Zhou;M. Tang;Guohong Xiang;X. Fang;Xiu Liu;Boyuan Xiang;S. Hark;Mickael Martin;M. Touraton;T. Baron;Ying Lu;Siming Chen;Huiyun Liu;Zhaoyu Zhang
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文献类型:
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作者:
Taojie Zhou;M. Tang;Guohong Xiang;X. Fang;Xiu Liu;Boyuan Xiang;S. Hark;Mickael Martin;M. Touraton;T. Baron;Ying Lu;Siming Chen;Huiyun Liu;Zhaoyu Zhang
Monolithic integration of efficient III–V light-emitting sources on planar on-axis Si (001) has been recognized as an enabling technology for realizing Si-based photonic integrated circuits (PICs). The field of microdisk lasers employing quantum dot (QD) materials is gaining significant momentum because it allows massive-scalable, streamlined fabrication of Si-based PICs to be made cost effectively. Here, we present InAs/GaAs QD microdisk lasers monolithically grown on on-axis Si (001) substrate with an ultra-low lasing threshold at room temperature under continuous-wave optical pumping. The lasing characteristics of microdisk lasers with small diameter (D) around 2 μm and sub-wavelength scale (D∼1.1 μm) are demonstrated, with a lasing threshold as low as ∼3 μW. The promising lasing characteristics of the microdisk lasers with ultra-low power consumption and small footprint represent a major advance towards large-scale, low-cost integration of laser sources on the Si platform.