Quantitative evaluation of magnetocrystalline anisotropy of columnar grains and thickness of initial layer in CoCr-based perpendicular media
Quantitative evaluation of magnetocrystalline anisotropy of columnar grains and thickness of initial layer in CoCr-based perpendicular media
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CoCr基垂直介质中柱状晶磁晶各向异性和初始层厚度的定量评估
DOI：
10.1063/1.1445467
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发表时间：
2002
影响因子：
4
通讯作者：
M. Takahashi
中科院分区：
文献类型：
--
作者：
S. Saito;D. Hasegawa;F. Hoshi;D. Djayaprawira;M. Takahashi
我们提出了一个定量分析，使用垂直扭矩来评估初始层的厚度，其中包括纳米晶晶粒，其c轴是三维随机取向，和固有的柱状晶粒的磁晶各向异性与其c平面平行的膜平面CoCr基垂直薄膜介质。通过将这种分析应用于CoNiCrTa，CoCrPtTa和CoCrPtB介质，我们发现，在HCP结构的Co60Cr40中间层上外延生长的CoCrPtB介质中，可以完全去除初始层。
We propose a quantitative analysis using perpendicular torquemetry to evaluate the thickness of the initial layer which consists of nanocrystalline grains, whose c axes are three-dimensionally randomly oriented, and the intrinsic magnetocrystalline anisotropy of the columnar grains with its c plane parallel to the film plane for CoCr-based perpendicular thin-film media. By applying this analysis to CoNiCrTa, CoCrPtTa, and CoCrPtB media, we found that the initial layer can be completely removed in the CoCrPtB medium epitaxially grown on an hcp-structured Co60Cr40 intermediate layer.