Critical thickness for two‐dimensional tearing instability
Critical thickness for two‐dimensional tearing instability
复制标题
二维撕裂不稳定性的临界厚度
DOI：
10.1029/2003gl018955
复制
发表时间：
2004
影响因子：
5.2
通讯作者：
M. Fujimoto
中科院分区：
文献类型：
--
作者：
K. Tanaka;I. Shinohara;M. Fujimoto
通过二维（2 - D）全粒子模拟研究了撕裂模式饱和状态对当前薄片厚度的依赖性。当取系统长度Lx为最大生长模式的波长Lx = λmax = 12D （D：电流片的半厚度）时，当D > dcr1 = 3.5 λe （λe为电子惯性长度）时，发现不稳定性达到饱和而不会产生明显的重联。当系统长度加倍Lx = 2λmax时，d> Dcr2nd = 2.7λh （λh为离子-电子杂化惯性长度）对系统长度的影响不显著。将这些2 - D结果与最近的3 - D结果进行比较，可以清楚地表明，三维效应减少了电流片厚度，因此即使D > dcr1也可以快速产生大量重连。
Dependence of tearing mode saturation state on the current sheet thickness is investigated by two‐dimensional (2‐D) full particle simulations. When the system length Lx is taken to be the wavelength of the maximum growth mode Lx = λmax = 12D (D: half‐thickness of the current sheet), the instability is found to saturate without producing significant reconnection if D > Dcr1st = 3.5 λe, where λe is the electron inertial length. When the system length is doubled Lx = 2λmax, only insignificant effects are available for D > Dcr2nd = 2.7λh, where λh is the ion‐electron hybrid inertial length. Comparing these 2‐D results with a recent 3‐D result, it is shown clearly that a three‐dimensional effect reduces the current sheet thickness and thus leads to quick production of substantial reconnection even if D > Dcr1st.