Molecular dynamics simulation of AlN thin films under nanoindentation

Molecular dynamics simulation of AlN thin films under nanoindentation
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纳米压痕下AlN薄膜的分子动力学模拟

DOI:
10.1016/j.ceramint.2016.11.218
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发表时间:
2017-04
影响因子:
5.2
通讯作者:
Peng XH
Peng XH
中科院分区:
材料科学1区
文献类型:
--
作者:
Xiang Henggao;Li Haitao;Fu Tao;Zhao Yinbo;Huang Cheng;Zhang Gang;Peng Xianghe;Li Haitao;Peng Xianghe;Li HT;Peng XH

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采用大尺度分子动力学方法模拟纳米压痕过程,研究了纤锌矿结构氮化铝(B4-AlN)的结构变形。在AlN(0001)薄膜中发现了纳米压痕诱导的B4-B1相变、非晶化和位错滑移,表明B4-B1相变的路径包括两个过程:N和Al原子沿着[0001]轴的反平行垂直运动和两种原子的水平重排。压痕力-深度(P-h)曲线显示了轻微和严重的弹出事件。结果表明,P-h曲线中前三个较小的载荷下降与非晶组织的形核有关,而随后的主要载荷下降则与位错的形核和扩展有关。AlN薄膜中的位错包括完全位错和Shockley部分位错,Shockley部分位错与位错环扩展过程中I2型本征层错的形成有关。
A large-scale molecular dynamics (MD) simulation of nanoindentation was performed to study the structural deformation on wurtzite aluminum nitride (B4-AlN). The nanoindentation induced B4-B1 phase-transition, amorphization and dislocation glide in AlN (0001) thin films were found. It shows that the B4-B1 phase-transition path includes two processes: an anti-parallel vertical movement of N and Al atoms along the [0001] axis, followed by horizontal rearrangements of the two types of atoms. Indentation force-depth (P-h) curve shows minor and major pop-in events. Detailed analysis of the results shows that the first three minor load drops in theP-hcurve are related to the nucleation of amorphous structure, whereas the subsequent major load drop is related to the dislocation nucleation and expansion. The dislocations in AlN thin film involve perfect dislocations and Shockley partial dislocations, the latter is associated with the formation of intrinsic stacking faults (SFs) typeI2during the expansion of dislocation loops.
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