SINGLE CRYSTAL MEASUREMENT OF ATOMIC SCATTERING FACTOR OF ALUMINIUM
SINGLE CRYSTAL MEASUREMENT OF ATOMIC SCATTERING FACTOR OF ALUMINIUM
复制标题
DOI：
10.1080/14786436708220896
复制
发表时间：
1967-01-01
影响因子：
1.6
通讯作者：
DEMARCO, JJ
中科院分区：
文献类型：
--
作者：
DEMARCO, JJ
本文用透射法测量了薄[110]铝晶体的原子绝对散射因子。利用Mo Kα辐射，入射发散角为几分之一弧，研究了晶体表面上不同镶嵌分布的反射和透射谱线轮廓。二次消光的校正是通过将晶体的每种设置的衍射强度增加未发生衍射时与衍射期间的相应透射强度的测量比率来进行的。由于原子的表观散射因子与反射半宽无关，因此认为一次消光的影响可以忽略不计，再加上5 ~ 13%的二次消光修正，所得的原子散射因子与以前报道的铝粉的结果一致。这些结果，加上最近对铜的完美晶体的测量，表明理论和实验之间存在显着差异。
Absolute atomic scattering factors have been, measured from a thin [110] aluminium crystal in transmission. Using Mo Kα radiation, with an incident divergence of a few minutes of are, the reflected and transmitted line profiles for varying mosaic distributions over the face of the crystal were examined. A correction for secondary extinction was made by increasing the diffracted intensity for each setting of the crystal by a measured ratio of the corresponding transmitted intensity when no diffraction is taking place to that during diffraction. Since the apparent atomic scattering factor was observed to be independent of reflection half-width, the effect of primary extinction is believed to be negligible.Imposing a measured secondary extinction correction that ranged from 5 to 13%, the atomic scattering factors thus obtained were in agreement with those previously reported on aluminium powder. These results, together with recent measurements on perfect Crystals of copper, indicate a significant discrepancy between theory and experiment.