Nanoscale Thermoelectrics: A Study of the Absolute Seebeck Coefficient of Thin Films
Nanoscale Thermoelectrics: A Study of the Absolute Seebeck Coefficient of Thin Films
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纳米级热电学:薄膜绝对塞贝克系数的研究
DOI:
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发表时间:
2014
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影响因子:
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通讯作者:
Sarah C. Mason
中科院分区:
文献类型:
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作者:
Sarah C. Mason
The worlds demand for energy is ever increasing. Likewise, the environmental impact of climate change due generating that energy through combustion of fossil fuels is increasingly alarming. Due to these factors new sources of renewable energies are constantly being sought out. Thermoelectric devices have the ability to generate clean, renewable, energy out of waste heat. However promising that is, their inefficiency severely inhibits applicability and practical use. The usefulness of a thermoelectric material increases with the dimensionless quantity, ZT , where, Z = S2σ/κ, and S, σ, and κ are the Seebeck coefficient and electrical and thermal conductivities respectively. These characteristic material parameters have interdependent energy transport contributions that classically prohibit the optimization of one with out the detriment of another. Encouraging advancements of ZT have occurred in the past ten years due to the decoupling of the thermal and electrical conductivity. Further advancements are necessary in order to produce applicable devices. One auspicious way of decoupling or tuning energy transport properties, is through size reduction to the nanoscale. However, with reduced dimensions come complications in measuring material properties. Measurements of properties such as the Seebeck coefficient, S, are primarily contingent upon the measurement apparatus. The Seebeck coefficient is defined as the amount of voltage generated by a thermal gradient. Measuring a thermally generated voltage by traditional methods gives, V = (Ssample − Slead)∆T . If accurate values of, Slead, are available, simple subtraction provides the answer. This is rarely the case in nanoscale measurement