Structural, FTIR and photoluminescence properties of ZnS:Cu thin films by chemical bath deposition method
Structural, FTIR and photoluminescence properties of ZnS:Cu thin films by chemical bath deposition method
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DOI：
10.1016/j.matlet.2012.11.091
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发表时间：
2013-02-15
影响因子：
3
通讯作者：
Kumar, M. Ashok
中科院分区：
文献类型：
--
作者：
Muthukumaran, S.;Kumar, M. Ashok
采用中性pH溶液化学镀法在玻璃衬底上制备了ZnS：Cu薄膜。Cu在0和0.1 M%之间变化。XRD测量显示六方结构，平均晶体尺寸在1.67和2.47 nm之间（低于玻尔直径）。能量色散X射线光谱揭示了Zn-S晶格中Cu的存在。Cu掺杂使Zn-S的晶格常数增大，粒径减小，XRD峰位发生了小的位移，表明Cu ~（2+）离子取代了Zn-S晶格。在光致发光光谱中观察到的绿色发射从506 nm到519 nm的红移证实了嵌入Zn-S基质中的Cu 2+离子的存在。(C)2012爱思唯尔有限公司版权所有。
ZnS:Cu thin films were deposited on glass substrate using chemical bath by neutral pH solution synthesis route. Cu is varied between 0 and 0.1 M%. The XRD measurement shows hexagonal structure with the average crystalline size between 1.67 and 2.47 nm (below Bohr diameter). Energy dispersive X-ray spectrum reveals the presence of Cu in the Zn-S lattice. The increase of lattice parameters, the reduction of particle size and a small shift in XRD peaks by Cu-doping reveals the substitution of Cu2+ ions into the Zn-S lattice. The observed red shift of green emission from 506 to 519 nm in photoluminescence spectra confirms the presence of Cu2+ ions that are embedded in the Zn-S matrix. (C) 2012 Elsevier B.V. All rights reserved.