A Microdiffraction Method for the Characterization of Partial Disclinations in Plastically Deformed Metals by TEM
A Microdiffraction Method for the Characterization of Partial Disclinations in Plastically Deformed Metals by TEM
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DOI：
10.1002/(sici)1521-396x(199910)175:2
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发表时间：
1999-10
期刊：
影响因子：
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通讯作者：
V. Klemm;P. Klimanek;M. Seefeldt
中科院分区：
文献类型：
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作者：
V. Klemm;P. Klimanek;M. Seefeldt
偏斜的概念可以用来描述在大应变变形下结晶金属的旋转子结构。本文提出了一种利用局部取向偏差测量的透射电镜微衍射方法，该方法可以识别出偏差。研究了室温下轧制厚度降低50%和70%的铜单晶和多晶，发现在胞块边界的三结处存在部分斜位。偏斜的强度在1.5°~ 2°范围内，与理论预期一致。
The disclination concept can be used to describe rotational substructures developing under large-strain deformation of crystalline metals. The paper presents a TEM microdiffraction method using local misorientation measurements which allows the identification of disclinations. Copper single as well as polycrystals rolled down to 50% and 70% thickness reduction at room temperature were investigated and partial disclinations were found in triple junctions of cell-block boundaries. The power of the partial disclinations lies in the range of 1.5° to 2°, in agreement with theoretical expectations.