Nanoscale Focus Pinspot for High-Purity Quantum Emitters via Focused-Ion-Beam-Induced Luminescence Quenching
Nanoscale Focus Pinspot for High-Purity Quantum Emitters via Focused-Ion-Beam-Induced Luminescence Quenching
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DOI：
10.1021/acsnano.1c00587
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发表时间：
2021-06-24
期刊：
影响因子：
17.1
通讯作者：
Cho, Yong-Hoon
中科院分区：
文献类型：
--
作者：
Choi, Minho;Jun, Seongmoon;Cho, Yong-Hoon
外延生长的量子点，特别是嵌入光子结构中的量子点，作为按需单光子源在各种量子光子系统中发挥着重要作用。然而，这些量子点经常受到相邻的不需要的发射体的影响，这导致了量子点发射的背景噪声，并从根本上限制了单光子纯度。在本文中，一个纳米级的焦点针尖（NFP）技术，使用聚焦离子束诱导的发光猝灭，使我们能够提高单光子纯度从网站控制的量子点作为一个概念验证实验。QD发射的光学质量没有劣化，同时QD的信噪比得到改善。此外，量子点后的NFP技术揭示了单光子性质，在进一步升高的温度下，由于减少的背景噪声。由于NFP技术是非破坏性的，它保留了明显的物理结构和光子功能，从而表明其应用于各种高纯度量子发射器，特别是集成在光子器件和电路中的有前途的潜力。
Epitaxially grown quantum dots (QDs), especially embedded in photonic structures, play an essential role in various quantum photonic systems as on-demand single-photon sources. However, these QDs often suffer from adjacent unwanted emitters, which contribute to the background noise of the QD emission and fundamentally limit the single-photon purity. In this paper, a nanoscale focus pinspot (NFP) technique using focused-ion-beam-induced luminescence quenching enables us to improve single-photon purity from site-controlled QD as a proof-of-concept experiment. The optical quality of the QD emission is not degraded while the signal-to-noise ratio of the QD is improved. Moreover, the QD after the NFP technique reveals the single-photon nature at further elevated temperatures owing to the reduced background noise. As the NFP technique is nondestructive, it retains the apparent physical structures and photonic functions, thereby indicating its promising potential for applying diverse high-purity quantum emitters, particularly integrated in photonic devices and circuits.