A method for calculating the complex refractive index of inhomogeneous thin films
A method for calculating the complex refractive index of inhomogeneous thin films
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DOI：
10.1088/0022-3727/47/20/205301
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发表时间：
2014-05
期刊：
影响因子：
--
通讯作者：
P. Manley;G. Yin;M. Schmid
中科院分区：
文献类型：
--
作者：
P. Manley;G. Yin;M. Schmid
利用传输矩阵法和反射/透射法计算了非均匀薄膜的复折射率。为此，我们开发了薄膜内部不均匀的三维分布模型和光在不均匀中的传播模型。该模型包括将光分成来自薄膜均匀部分(相干建模)和非均匀部分(非相干建模)的贡献。薄膜的测量表明了各向同性的不均匀分布，这在模拟中得到了复制。薄膜内部的光传播模型被实现为允许评估薄膜在衬底上的反射和透射率的传递矩阵程序。利用这一结果和反射和透射率的实验数据，计算了非均匀CuInSe2薄膜的复折射率n+ik。所得的n和k与均匀CuInSe_2薄膜的n和k比应用于非均匀样品的标准传递矩阵法的结果更接近。短波长处的n值偏离齐次值，表明短波标量散射理论的崩溃。
We calculate the complex refractive index of inhomogeneous thin films using the transfer matrix method and reflection/transmission measurements. To this end we have developed a model for both the 3D distribution of inhomogeneities inside thin films and for light propagation through the inhomogeneities. The model involves splitting the light into contributions from the homogeneous section of the film (modelled coherently) and the inhomogeneous sections (modelled incoherently). Measurements of the film implied an isotropic inhomogeneity distribution, which was replicated in the simulation. The model for light propagation inside a film was implemented into a transfer matrix program allowing for the evaluation of the reflection and transmission of the thin film on a substrate. Using this result and experimental data for the reflection and transmission, the complex refractive index, n + ik, of an inhomogeneous CuInSe2 film was calculated. The resulting n and k were in much closer agreement to the n and k for a homogeneous CuInSe2 film than those for the standard transfer matrix approach applied to the data of the inhomogeneous sample. The n value at short wavelengths deviates from the homogeneous value suggesting a breakdown of the scalar scattering theory for short wavelengths.