LOW-TEMPERATURE ATOMIC FORCE MICROSCOPE USING PIEZORESISTIVE CANTILEVERS
LOW-TEMPERATURE ATOMIC FORCE MICROSCOPE USING PIEZORESISTIVE CANTILEVERS
复制标题
使用压阻悬臂梁的低温原子力显微镜
DOI：
10.1063/1.1149945
复制
发表时间：
1999
影响因子：
1.6
通讯作者：
R. E. Thomson
中科院分区：
文献类型：
--
作者：
R. E. Thomson
本文介绍了一种易于操作的低温原子力显微镜（AFM）的设计，该显微镜包含压阻悬臂梁。与基于激光偏转方案或干涉仪的原子力显微镜相比，该仪器在低温下更容易制造和操作，因为在温度变化后不需要对仪器进行机械调整。通过使用双管扫描仪组件，热膨胀对AFM尖端到样品距离的影响最小化。该设计包括一个简单的机制，可以在温度降低时将样品支架锁定在适当的位置。这AFM是紧凑和刚性，使其能够用于传统的低温液体储存杜瓦瓶。所有用于AFM结构的材料都是超高真空兼容的。
This article describes the design of an easy-to-operate low-temperature atomic force microscope (AFM) that incorporates piezoresistive cantilevers. The instrument is easier to build and to operate at cryogenic temperatures than AFMs based on laser deflection schemes or interferometers because no mechanical adjustments of the instrument are necessary after a change of temperature. The effects of thermal expansion on the AFM’s tip-to-sample distance are minimized by the use of a double tube scanner assembly. The design includes a simple mechanism that locks the sample holder in place as the temperature is lowered. This AFM is compact and rigid, enabling it to be used in a conventional cryogenic liquid-storage Dewar. All of the materials used in the construction of the AFM are ultra-high-vacuum compatible.