Stability of 10B4C thin films under neutron radiation

Stability of 10B4C thin films under neutron radiation
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DOI:
10.1016/j.radphyschem.2015.04.006
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发表时间:
2015-08-01
影响因子:
2.9
通讯作者:
Hall-Wilton, Richard
Hall-Wilton, Richard
中科院分区:
化学3区
文献类型:
--
作者:
Hoglund, Carina;Zeitelhack, Karl;Hall-Wilton, Richard

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(B4 C)-B-10薄膜已被证明非常适合作为下一代中子探测器中的中子转换材料,取代先前主要使用的He-3。在这方面的贡献,我们表明,在现实条件下,(B_4C)-B-10薄膜不会受到中子辐照和相互作用,他们将暴露在中子探测器多年。1 μ m厚的(B4 C)-B-10薄膜用直流磁控溅射沉积在Al或Si衬底上。将沉积的薄膜暴露于冷中子束,其通量高达1.1 × 10(14)cm(-2),平均波长为6.9埃。辐照和沉积的参考样品,其特征在于与飞行时间的弹性反冲检测分析,扫描电子显微镜,透射电子显微镜,X射线光电子能谱,和X射线衍射。我们表明,只有1.8 ppm的B-10原子被消耗,并且在测量精度范围内的中子相互作用不会改变膜的组成。辐照不会使膜粘附性劣化,并且没有迹象表明它导致0.095 GPa的沉积膜的残余应力值增加。从肉眼可见到原子水平研究,使用上述表征技术未发现辐照的变化。(C)2015作者由爱思唯尔有限公司出版。这是一篇在CC BY-NC-ND许可证下的开放获取文章(http://creativecommons.org/licenses/by-nc-nd/4.0/)。
Thin films of (B4C)-B-10 have shown to be very suitable as neutron-converting material in the next generation of neutron detectors, replacing the previous predominantly used He-3. In this contribution we show under realistic conditions that (B4C)-B-10 films are not damaged by the neutron irradiation and interactions, which they will be exposed to under many years in a neutron detector. 1 mu m thick (B4C)-B-10 thin films were deposited onto Al or Si substrates using dc magnetron sputtering. As-deposited films were exposed to a cold neutron beam with fluences of up to 1.1 x 10(14) cm(-2) and a mean wavelength of 6.9 angstrom. Both irradiated and as-deposited reference samples were characterized with time-of-flight elastic recoil detection analysis, scanning electron microscopy, transmission electron microscopy, X-ray photoemission spectroscopy, and X-ray diffraction. We show that only 1.8 ppm of the B-10 atoms were consumed and that the film composition does not change by the neutron interaction within the measurement accuracy. The irradiation does not deteriorate the film adhesion and there is no indication that it results in increased residual stress values of the as-deposited films of 0.095 GPa. From what is visible with the naked eye and down to atomic level studies, no change from the irradiation could be found using the above-mentioned characterization techniques. (C) 2015 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).