Heteroepitaxy and characterization of CuGaSe2 layers grown by low‐pressure metalorganic chemical‐vapor deposition
Heteroepitaxy and characterization of CuGaSe2 layers grown by low‐pressure metalorganic chemical‐vapor deposition
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低压金属有机化学气相沉积 CuGaSe2 层的异质外延和表征
DOI:
10.1063/1.357503
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发表时间:
1994
影响因子:
3.2
通讯作者:
H. Higuchi
中科院分区:
文献类型:
--
作者:
S. Chichibu;Y. Harada;M. Uchida;T. Wakiyama;S. Matsumoto;S. Shirakata;S. Isomura;H. Higuchi
CuGaSe2 chalcopyrite compounds were grown heteroepitaxially on both GaAs and GaP substrates by means of the low‐pressure metalorganic chemical‐vapor deposition method. Optical and structural properties were characterized comprehensively by photoreflectance (PR), photoluminescence (PL), x‐ray diffraction, transmission electron microscopy, transmission electron diffraction, and electron‐probe microanalysis. The CuGaSe2 epilayers had c(001) surface on GaAs(001) substrates and a(100) surface on GaP(001) substrates, respectively, the results being similar to the case of CuAlSe2. Energies of A, B, and C excitons associated with uppermost valence bands were determined from analysis of PR spectra, and the energies of good‐quality epilayers are close to those of the bulk crystal. The slight increase of the crystal‐field splitting in the valence bands were discussed in terms of the lattice strain in the epilayer caused by the lattice mismatch. Low‐temperature PL spectra exhibited an intense peak at 1.71 eV, the ene...