Surface Orientation of Main and Side Chains of Polyimide Alignment Layer Studied by Near-Edge X-ray Absorption Fine Structure Spectroscopy

Surface Orientation of Main and Side Chains of Polyimide Alignment Layer Studied by Near-Edge X-ray Absorption Fine Structure Spectroscopy
复制标题

DOI：
10.1021/jp010482g
复制
发表时间：
2001-08
期刊：
Journal of Physical Chemistry B
影响因子：
3.3
通讯作者：
T. Sakai;and Ken Ishikawa;H. Takezoe;Noritaka Matsuie;Yasushi Yamamoto;H. Ishii;Y. Ouchi;H. Oji;K. Seki
T. Sakai;and Ken Ishikawa;H. Takezoe;Noritaka Matsuie;Yasushi Yamamoto;H. Ishii;Y. Ouchi;H. Oji;K. Seki
中科院分区：
化学3区
文献类型：
--
作者：
T. Sakai;and Ken Ishikawa;H. Takezoe;Noritaka Matsuie;Yasushi Yamamoto;H. Ishii;Y. Ouchi;H. Oji;K. Seki

文献摘要

被引文献

相似文献

用近边X射线吸收精细结构谱（NEXAFS）研究了用于液晶取向的聚酰亚胺（PI）主链和侧链的平均近表面取向。
The average near-surface orientation of the main and side chains of polyimide (PI) for liquid crystal (LC) alignment has been studied by near-edge X-ray absorption fine structure (NEXAFS) spectrosc...