Scanning tunneling spectroscopy of Fe/W(110) using iron covered probe tips
Scanning tunneling spectroscopy of Fe/W(110) using iron covered probe tips
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使用铁覆盖探针尖扫描 Fe/W(110) 隧道光谱
DOI：
10.1116/1.580577
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发表时间：
1997
期刊：
影响因子：
--
通讯作者：
R. Wiesendanger
中科院分区：
文献类型：
--
作者：
M. Bode;R. Pascal;R. Wiesendanger
我们使用铁覆盖的钨探针尖端，通过扫描隧道光谱研究了 W(110) 基底上 Fe 薄膜的电子结构。与早期使用钨尖端进行的实验相比，我们发现在费米能级上方的亚单层 Fe 覆盖处，微分电导率 dI/dV 具有最小值。在 1.3 ML 的覆盖范围下，在第二层的 Fe 岛上方测量到一个明显的峰，该峰位于费米能级上方约 0.9 eV 处，即在空样品状态下。发现该空态峰对残留气体的污染极其敏感，已知残留气体也会影响第二层岛的磁性状态。
We have used iron covered tungsten probe tips to study the electronic structure of thin films of Fe on a W(110) substrate by means of scanning tunneling spectroscopy. In contrast to earlier experiments which were performed with tungsten tips we have found a minimum in the differential conductivity dI/dV at submonolayer Fe coverage just above the Fermi level. At a coverage of 1.3 ML a pronounced peak is measured above Fe islands of the second layer approximately 0.9 eV above the Fermi level, i.e., in the empty sample states. This empty state peak was found to be extremely sensitive to contamination from the residual gas which is also known to influence the magnetic state of the second layer islands.