Testing with Large Parameter Sets for the Development of Embedded Systems in the Automation Domain
Testing with Large Parameter Sets for the Development of Embedded Systems in the Automation Domain
复制标题
使用大参数集测试自动化领域嵌入式系统的开发
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
Detlef Streitferdt
中科院分区：
文献类型：
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作者：
Florian Kantz;Thomas Ruschival;P. Nenninger;Detlef Streitferdt
自动化领域中当前设备的测试不能在数学上彻底地完成，因为有大量可能的测试用例，更重要的是，执行所有测试用例的时间巨大。因此，在测试域中需要大幅减少测试用例的执行时间。本文讨论了通过减少参数集排列、递归回溯和成对测试来减少测试用例执行时间的两种可能性。自动化领域中的设备的测试基于它们的行为(黑盒测试)和影响行为的设备的参数。包括参数之间的约束的参数模型的组合，递归回溯和成对测试可以使参数置换空间减少99%以上。本文介绍了这种缩减的现状，并提出了基于“参数集”排列缩减的测试用例结构化缩减的未来方向。
Testing of current devices in the automation domain cannot be done mathematically exhaustive due to the huge number of possible test cases and, even more important, the tremendous amount of time for the execution of all test cases.Thus, a dramatic reduction is needed in the testing domain.This paper discusses two possibilities for the reduction of test case execution time by reducing the number of ”parameter set” permutations, recursive backtracking and pairwise testing.Testing of devices in the automation domain is based on their behavior (black box testing) and the parameters of the devices,which influence the behavior.The combination of a parameter model including constraints between parameters, recursive backtracking and pairwise testing can result in the reduction of the parameter permutation space by more than 99%. This paper presents the current status of this reduction and proposes a future direction towards a structured reduction of test cases based on the reduction of the ”parameter set” permutations.