Study on the mechanism of the growth and shrinkage of stacking fault tetrahedral during the fluctuation of their size under electron irradiation
Study on the mechanism of the growth and shrinkage of stacking fault tetrahedral during the fluctuation of their size under electron irradiation
复制标题
电子辐照下堆垛层错四面体尺寸波动过程中生长和收缩机理研究
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
K.Ono
中科院分区：
文献类型：
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作者：
K.Arakawa;S.Arai;H.Orihara;K.Ono
