Eddy‐Current Testing with GMR Magnetic Sensor Arrays
Eddy‐Current Testing with GMR Magnetic Sensor Arrays
复制标题
使用 GMR 磁传感器阵列进行涡流测试
DOI:
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复制
发表时间:
2004
期刊:
影响因子:
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通讯作者:
S. Smith
中科院分区:
文献类型:
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作者:
Carl H. Smith;R. Schneider;T. Dogaru;S. Smith
The advent of GMR magnetic sensors and GMR sensor arrays with frequency‐independent sensitivity offers improvements in speed, depth, and resolution in eddy‐current testing. Arrays of GMR magnetic sensors allow rapid scanning of an area for defects in a single pass. The small size and low power consumption of these solid‐state magnetic sensors enable the fabrication of compact arrays of sensors on circuit boards and even on‐chip sensor arrays. Arrays have been fabricated with sensor spacing as small as 5 micrometers when fine resolution is required. GMR sensor elements can be deposited on active silicon substrates facilitating on‐chip signal processing and multiplexing. This integration simplifies the sensor/signal‐processing interface, minimizes the number of leads, and can reduce the effect of noise. This paper will discuss the technology of fabricating arrays on GMR sensors, especially on‐chip arrays. Integrated sensor arrays with on‐chip signal processing and multiplexing will be described. Finally, so...