Electrical measurements in high Tc Bi‐Sr‐Ca‐Cu‐O thin films
Electrical measurements in high Tc Bi‐Sr‐Ca‐Cu‐O thin films
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高 Tc Bi-Sr-Ca-Cu-O 薄膜的电学测量
DOI：
10.1063/1.99868
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发表时间：
1988
影响因子：
4
通讯作者：
K. Wasa
中科院分区：
文献类型：
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作者：
K. Setsune;K. Hirochi;H. Adachi;Y. Ichikawa;K. Wasa
对高T_c的多晶薄膜进行了电学测量。在100K下，超导态的电阻小于10−8Ω cm，直接证实了77K时的临界电流密度大于105A/cm~2，临界电流与温度的关系可用(1−T/T_c)~2近似表示。
Electrical measurements were performed on polycrystalline thin films of the high Tc Bi‐Sr‐Ca‐Cu‐O system. The resistance of the superconducting state was confirmed to be smaller than 10−8 Ω cm at 100 K. It is confirmed directly that the critical current density at 77 K was in excess of 105 A/cm2 and the dependence of critical current on temperature was able to be represented approximately by (1−T/Tc )2.
DOI：
10.1007/bf01303701
发表时间：
1986-01-01
期刊：
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER
影响因子：
--
作者：
BEDNORZ, JG;MULLER, KA
通讯作者：
MULLER, KA