FREE-SPACE MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MAGNETIC-MATERIALS AT MICROWAVE-FREQUENCIES
FREE-SPACE MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MAGNETIC-MATERIALS AT MICROWAVE-FREQUENCIES
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DOI：
10.1109/19.52520
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发表时间：
1990-04-01
影响因子：
5.6
通讯作者：
VARADAN, VK
中科院分区：
文献类型：
--
作者：
GHODGAONKAR, DK;VARADAN, VV;VARADAN, VK
利用一个工作在8.240 GHz频率范围内的自由空间测量系统测量了平面样品的反射系数和透射率S/B_(11)和S/B_(21)。根据S/SUB11/和S/SUB21/的测量值计算出复介电常数和磁导率。测量系统由发射和接收喇叭透镜天线、网络分析仪、模式转换和计算机组成。通过使用点聚焦透镜天线，使样品边缘的衍射效应最小化。通过使用自由空间TRL(直通、反射、线)校准技术，对通过样品表面的天线之间的多次反射引起的误差进行了校正。对于薄的、可弯曲的样品，样品必须夹在两个半波长(在中间波段)的石英板之间，以消除下垂。结果表明，在8.6-13.4 GHz的频率范围内的材料，如特氟龙，钠硼硅酸盐玻璃，和微波吸收材料。
A free-space measurement system operating in the 8.2-40-GHz frequency range is used to measure the reflection and transmission coefficients, S/sub 11/ and S/sub 21/, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from the measured values of S/sub 11/ and S/sub 21/. The measurement system consists of transmit and receive horn lens antennas, a network analyzer, mode transitions, and a computer. Diffraction effects at the edges of the sample are minimized by using spot-focusing lens antennas. Errors due to multiple reflections between antennas via the surface of the sample are corrected by using a free-space TRL (thru, reflect, line) calibration technique. For thin, flexible samples, the sample had to be sandwiched between two half-wavelength (at mid-band) quartz plates to eliminate sagging. Results are reported in the frequency range of 8.6-13.4 GHz for materials such as Teflon, sodium borosilicate glass, and microwave-absorbing materials.<>