Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter
Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter
复制标题
使用衍射光栅分束器在扫描透射电子显微镜中实现可解释且高效的干涉对比
DOI:
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发表时间:
2018
影响因子:
4.6
通讯作者:
C. Ophus
中科院分区:
文献类型:
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作者:
Tyler R. Harvey;F. Yasin;J. Chess;J. Pierce;R. D. Reis;V. B. Ozdol;P. Ercius;J. Ciston;Wenchun Feng;N. Kotov;B. McMorran;C. Ophus
Author(s): Harvey, TR; Yasin, FS; Chess, JJ; Pierce, JS; Dos Reis, RMS; Ozdol, VB; Ercius, P; Ciston, J; Feng, W; Kotov, NA; McMorran, BJ; Ophus, C | Abstract: © 2018 American Physical Society. Efficient imaging of biomolecules, two-dimensional materials, and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope (STEM) using a nanofabricated diffraction grating to produce multiple probe beams. The measured phase is more interpretable than phase-contrast scanning transmission electron microscopy techniques without an off-axis reference wave, and the resolution could surpass that of off-axis electron holography. We apply this technique, called STEM holography, to image nanoparticles, carbon substrates, and electric fields. The contrast observed in experiments agrees well with contrast predicted in simulations.