High-resolution electron microscopy of electron irradiation damage in apatite
High-resolution electron microscopy of electron irradiation damage in apatite
复制标题
磷灰石电子辐照损伤的高分辨率电子显微镜
DOI：
10.1080/01422448208226908
复制
发表时间：
1982
影响因子：
1
通讯作者：
J. V. Sanders
中科院分区：
文献类型：
--
作者：
D. Nelson;J. D. McLean;J. V. Sanders
摘要利用透射电镜原位观察了电子辐照对磷灰石的损伤。这种类型的辐射损伤是通过六边形的斑块来识别的，有时直径小至2个晶胞，晶体学边缘指示多面的三维形状。二维晶格对比在整个贴片区域持续存在。这种类型的破坏过程中解释的辐射诱导的空隙率模型产生的磷灰石晶体结构中的阴离子位移。经过相当长时间（>20分钟）的强电子束照射后，磷灰石晶体结构发生局部非晶化和塌陷。
Abstract Electron irradiation-induced damage of apatite was observed in situ during examination by transmission electron microscopy. Radiation damage of this type was identified by hexagonally-shaped patches, sometimes as small as 2 unit cells in diameter, with crystallographic edges indicating a faceted three-dimensional shape. A two-dimensional lattice contrast continued throughout the area of the patch. This type of damaging process was interpreted in terms of a radiation-induced voidage model resulting from anion displacement in the apatite crystal structure. After reasonably long periods (>20 mins) of intense electron beam irradiation, local amorphization and collapse of the apatite crystal structure occurred.