Optical identification using imperfections in 2D materials
Optical identification using imperfections in 2D materials
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DOI：
10.1088/2053-1583/aa8b4d
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发表时间：
2017-12-01
期刊：
影响因子：
5.5
通讯作者：
Young, Robert J.
中科院分区：
文献类型：
--
作者：
Cao, Yameng;Robson, Alexander J.;Young, Robert J.
唯一标识对象或设备的能力对于身份验证非常重要。在制造过程中锁定在结构中的缺陷可用于提供难以复制的指纹。在本文中，我们提出了一种简单的光学技术来读取二维材料中纳米级缺陷的独特信息。晶体生长或制造过程中产生的缺陷会导致二维材料带隙的空间变化，这些变化可以通过光致发光测量来表征。我们展示了一种简单的设置，包括角度可调的透射滤光片、简单的光学器件和 CCD 相机，可以捕获空间相关的光致发光，从而从 2D 单层生成独特信息的复杂图。原子力显微镜用于验证测量的光学特征的来源，证明它是由纳米级缺陷造成的。这种利用二维材料进行光学识别的解决方案可以用作防止伪造的强大安全措施。
The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angleadjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.